Numerical techniques useful in the practice of ellipsometry
- 1 December 1995
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 270 (1-2) , 78-84
- https://doi.org/10.1016/0040-6090(95)06849-x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Numerical ellipsometry: enhancement of new algorithm for real-time, in situ film growth monitoringThin Solid Films, 1994
- Real time, in-situ ellipsometry solutions using artificial neural network pre-processingThin Solid Films, 1994
- Development of artificial neural networks for real time, in situ ellipsometry data reductionThin Solid Films, 1992
- In situ ellipsometric study of optical properties of ultrathin filmsApplied Optics, 1992
- A method for the solution of certain non-linear problems in least squaresQuarterly of Applied Mathematics, 1944