Modeling of Nitrogen High Dose Implantation into Silicon in the Energy Range of 150 to 330 keV
- 16 July 1989
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 114 (1) , 135-144
- https://doi.org/10.1002/pssa.2211140110
Abstract
No abstract availableKeywords
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