Crystal growth and defect characterization of heteroepitaxial III–V semiconductor films
- 1 January 1976
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 31 (1-2) , 3-23
- https://doi.org/10.1016/0040-6090(76)90351-5
Abstract
No abstract availableKeywords
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