X-ray image monitoring using a new soft x-ray plate: Ag/chalcogenide film

Abstract
A new soft x‐ray plate of Ag/chalcogenide film is proposed, which offers in situ monitoring of high‐resolution x‐ray images. Soft x‐ray exposure of synchrotron and undulator radiation causes color change in the Ag/chalcogenide film, capable of yielding a potential resolution on the order of 100 Å. In situ monitoring of the diffraction light of a He‐Ne laser‐beam irradiation on the film revealed the processes involved in recording x‐ray images of gratings during the exposure. The reflection light caused by scanning with the laser beam provided good reconstructed images. A possible application to future x‐ray holography is also described.

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