Recombination in germanium: Voltage-decay experiments on induced-junction devices and validity of the SRH model
- 1 December 1984
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 27 (12) , 1061-1066
- https://doi.org/10.1016/0038-1101(84)90045-5
Abstract
No abstract availableKeywords
Funding Information
- Natural Sciences and Engineering Research Council of Canada (A1330)
This publication has 10 references indexed in Scilit:
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