Electron tunneling detected by electrostatic force
- 27 November 2000
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 77 (22) , 3615-3617
- https://doi.org/10.1063/1.1330568
Abstract
A method is introduced for measuring the tunneling of electrons between a specially fabricated scanning probe microscope tip and a surface. The technique is based upon electrostatic force detection of charge as it is transferred to and from a small (10−17 F) electrically isolated metallic dot on the scanning probe tip. The methods for dot fabrication, charging, and discharging are described and electron tunneling to a sample surface is demonstrated.Keywords
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