An investigation of silicon-oxygen interactions using Auger electron spectroscopy
- 31 October 1971
- journal article
- Published by Elsevier in Surface Science
- Vol. 27 (3) , 499-515
- https://doi.org/10.1016/0039-6028(71)90184-1
Abstract
No abstract availableThis publication has 25 references indexed in Scilit:
- Oxygen sticking coefficients on clean (111) silicon surfacesSurface Science, 1969
- Measurements of oxygen adsorption on Si(111) surfaces by LEEDSurface Science, 1969
- The relation between current flow and oxygen adsorption in a reverse biassed silicon pn junctionSurface Science, 1967
- Measurement of oxygen adsorption on silicon by ellipsometryJournal of Physics and Chemistry of Solids, 1965
- Low Voltage Electron Diffraction Study of the Oxidation and Reduction of SiliconJournal of Applied Physics, 1962
- Oxygen Adsorption on Silicon and GermaniumJournal of Applied Physics, 1961
- The adsorption of oxygen on clean silicon surfacesJournal of Physics and Chemistry of Solids, 1960
- Structure and Adsorption Characteristics of Clean Surfaces of Germanium and SiliconThe Journal of Chemical Physics, 1959
- Adsorption of Oxygen on SiliconThe Journal of Chemical Physics, 1959
- Work function and emission studies on clean silicon surfacesJournal of Physics and Chemistry of Solids, 1959