LFSROM: A hardware test pattern generator for deterministic ISCAS85 test sets
- 30 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Test set embedding in a built-in self-test environmentPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Circuits for pseudoexhaustive test pattern generationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- A Class of Test Generators for Built-In TestingIEEE Transactions on Computers, 1983
- Design for Testability—A SurveyIEEE Transactions on Computers, 1982