Method for determination of charge density distribution in silicon nitride of MNOS structures

This publication has 5 references indexed in Scilit:

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  Solid-State Electronics, 1978
• Simple technique for determination of centroid of nitride charge in MNOS structures
  Applied Physics Letters, 1975
• Silicon nitride trap properties as revealed by charge−centroid measurements on MNOS devices
  Applied Physics Letters, 1975
• Measurements of charge propagation in Si3N4 films
  Applied Physics Letters, 1974
• Direct display of electron back tunneling in MNOS memory capacitors
  Applied Physics Letters, 1973