Infrared ellipsometer for the study of surfaces, thin films, and superlattices
- 1 February 1992
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 31 (4) , 471-478
- https://doi.org/10.1364/ao.31.000471
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
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