Inapplicability of the Sugiyama phase sum rule to very thin films
- 15 September 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 34 (6) , 4346-4349
- https://doi.org/10.1103/physrevb.34.4346
Abstract
The Sugiyama phase sum rule, derived for a free-electron model, implies that the Fermi energy of a thin film cannot be size dependent. This rule is shown to be invalid for very thin films ( Å) in a square-well model, since it depends on the incorrect assumption of local charge neutrality near the center of the film. The displacement of the potential barriers outward from the surfaces of very thin films in order to produce local charge neutrality in the interior is discussed. The size dependence found for the free-electron model is expected to persist in the presence of electron-electron interactions, though possibly with reduced magnitude.
Keywords
This publication has 26 references indexed in Scilit:
- Experimental study of quantum size effects in very thin metal filmsApplied Physics A, 1980
- Energies and fermi level of electrons in thin size-quantized metal filmsPhysica Status Solidi (b), 1977
- Superconducting transition temperature and other properties of thin metallic filmsPhysical Review B, 1975
- Electrons in a Well Potential: Density of States, Surface Energy, and Phase Rule for Wave FunctionsPhysica Status Solidi (b), 1975
- Sum rule for metal surfacesPhysical Review B, 1975
- Self-consistent charge density and surface electronic states for the (001) face of lithiumPhysical Review B, 1974
- Sum Rule for Crystalline Metal SurfacesPhysical Review B, 1973
- Boundary Conditions and Quantum Effects in Thin Superconducting FilmsPhysical Review B, 1965
- Calculations of Surface Energy for a Free-Electron MetalPhysical Review B, 1951
- The Nuclear Surface EnergyProceedings of the Physical Society. Section A, 1951