Tip-sample distance regulation for near-field scanning optical microscopy using the bending angle of the tapered fiber probe
- 1 November 1998
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 84 (9) , 4655-4660
- https://doi.org/10.1063/1.368706
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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