Reflectance Anisotropy of GaAs(100): Theory and Experiment
- 20 July 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 81 (3) , 721-724
- https://doi.org/10.1103/physrevlett.81.721
Abstract
The reflectance anisotropy has been calculated by microscopic tight-binding theory for various configurations of the As-rich GaAs(100) and reconstructions, based on precise atomic coordinates from ab initio total-energy minimization. The comparison to experimental reflectance anisotropy in combination with scanning tunneling microscopy and low energy electron diffraction allows one to identify precise correlations between structural units and optical features. Clear indications are obtained for the intermediate steps in the surface reconstruction transformation.
Keywords
This publication has 20 references indexed in Scilit:
- GaAs equilibrium crystal shape from first principlesPhysical Review B, 1996
- Optical Properties of Ordered As Layers on InP(110) SurfacesPhysical Review Letters, 1996
- Atomic structures of GaAs(100)-(2 × 4) reconstructionsSurface Science, 1996
- Real-time analysis of III–V-semiconductor epitaxial growthApplied Surface Science, 1996
- Theoretical and Experimental Optical Spectroscopy Study of Hydrogen Adsorption at Si(111)-()Physical Review Letters, 1996
- Surface quality and atomic structure of MBE-grown GaAs(100) prepared by the desorption of a protective arsenic layerSurface Science, 1996
- Hydrogen induced structure changes of GaAs(100) c(4 × 4), (2 × 4) and (4 × 2) surfacesSurface Science, 1996
- Energetics of GaAs(100)-(2×4) and -(4×2) reconstructionsPhysical Review Letters, 1993
- Optical in situ surface control during MOVPE and MBE growthPhilosophical Transactions A, 1993
- Microscopic calculation of the surface contribution to optical reflectivity: Application to SiPhysical Review B, 1986