The roughness of cleaved semiconductor surfaces
- 1 April 1973
- journal article
- Published by Elsevier in Surface Science
- Vol. 36 (1) , 109-122
- https://doi.org/10.1016/0039-6028(73)90249-5
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Capillarity and step interactions on solid surfacesSurface Science, 1971
- Surface studies by electron diffractionSurface Science, 1971
- Texture of surfaces cleaned by ion bombardment and annealingSurface Science, 1970
- LEED-investigation of step arrays on cleaved germanium (111) surfacesSurface Science, 1970
- Surface Processes in the Growth of Silicon on (111) Silicon in Ultrahigh VacuumJournal of Applied Physics, 1968
- LEED from surface steps on UO2 single crystalsSurface Science, 1968
- Microscopic Evidence of Plastic Deformation on Cleaved Germanium SurfacesJournal of Applied Physics, 1967
- Surface Decoration of Germanium and SiliconJapanese Journal of Applied Physics, 1964
- Decoration of Imperfections on Cleaved GermaniumJournal of Applied Physics, 1963
- Herstellung und Eigenschaften reiner HalbleiteroberflächenFortschritte der Physik, 1961