The back scattering of electrons by crystals at low and high energies
- 1 January 1974
- journal article
- Published by EDP Sciences in Revue de Physique Appliquée
- Vol. 9 (2) , 377-384
- https://doi.org/10.1051/rphysap:0197400902037700
Abstract
Electron scattering can be used as a tool for the study of crystalline surfaces, and for the study of defects in the région of the surface, at all energies. It is shown that contrast from diffraction effects appears in all parts of the secondary électron spectrum. This permits a variety of measurements of both the elastic and inelastic back scattered current to be used for metallurgical studies, especially in the high resolution scanning électron microscope at high électron energies. Scanning techniques at low énergies should also prove useful, and évidence is presented for the existence of similar effects down to 100 eVKeywords
This publication has 6 references indexed in Scilit:
- Kikuchi correlations in Auger electron spectroscopyApplied Physics Letters, 1973
- Dislocation images in the high resolution scanning electron microscopePhilosophical Magazine, 1972
- Beam threshold and surface resonance effects in low energy electron diffraction from Ni(100)Surface Science, 1972
- Observation of crystal defects using the scanning electron microscopePhilosophical Magazine, 1971
- Relativistic effects in low energy electron scattering from atomsAdvances in Physics, 1971
- Surface studies by electron diffractionSurface Science, 1971