Surface and in-plane characterization of YBa2Cu3O7 thin films grown by laser ablation
- 1 September 1991
- journal article
- Published by Elsevier in Physica C: Superconductivity and its Applications
- Vol. 179 (4) , 262-268
- https://doi.org/10.1016/0921-4534(91)92170-g
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- In Situ Reflection High Energy Electron Diffraction Observation During Growth of YBa2Cu3O7-x Thin Films by Activated Reactive EvaporationJapanese Journal of Applied Physics, 1989