Estimation methods for quality factors of inductors fabricated in silicon integrated circuit process technologies
- 1 January 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 33 (8) , 1249-1252
- https://doi.org/10.1109/4.705364
Abstract
No abstract availableKeywords
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