Analysis of amorphous carbon thin films by spectroscopic ellipsometry
- 1 May 1998
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 227-230, 617-621
- https://doi.org/10.1016/s0022-3093(98)00142-2
Abstract
No abstract availableKeywords
Funding Information
- National Science Foundation (DMR-9217169, DMR-8957159)
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