Test generation by activation and defect-drive (TEGAD)
- 31 March 1985
- journal article
- Published by Elsevier in Integration
- Vol. 3 (1) , 3-12
- https://doi.org/10.1016/0167-9260(85)90051-3
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Controllability/observability analysis of digital circuitsIEEE Transactions on Circuits and Systems, 1979
- Binary Decision DiagramsIEEE Transactions on Computers, 1978
- The Weighted Random Test-Pattern GeneratorIEEE Transactions on Computers, 1975
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967