Assessing the diagnostic power of test pattern sets
- 31 August 1990
- journal article
- Published by Elsevier in Microprocessing and Microprogramming
- Vol. 30 (1-5) , 413-419
- https://doi.org/10.1016/0165-6074(90)90276-f
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Failure diagnosis of structured VLSIIEEE Design & Test of Computers, 1989
- Accelerated Fault Simulation and Fault Grading in Combinational CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1987
- On the Acceleration of Test Generation AlgorithmsIEEE Transactions on Computers, 1983
- An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic CircuitsIEEE Transactions on Computers, 1981
- A New Approach to the Fault Location of Combinational CircuitsIEEE Transactions on Computers, 1972
- Fault Equivalence in Combinational Logic NetworksIEEE Transactions on Computers, 1971
- Diagnosis of Single-Gate Failures in Combinational circuitsIEEE Transactions on Computers, 1969
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967
- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966