Chlorine migration under electron bombardment observed by aes
- 31 December 1982
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 26 (3) , 247-257
- https://doi.org/10.1016/0368-2048(82)85032-9
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- The study of radiation‐induced chemical damage at solid surfaces using photoelectron spectroscopy: A reviewSurface and Interface Analysis, 1980
- Characterization of hydrogen species on TiO2 by electron-stimulated desorptionSurface Science, 1980
- Electron beam effects in Auger electron spectroscopy and scanning electron microscopySurface and Interface Analysis, 1979
- Ségrégation des impuretés et éléments d'alliage à la surface du titaneJournal of the Less Common Metals, 1977
- Low beam current density Auger spectroscopy and surface analysisSurface Science, 1977
- Electron-beam decomposition of UF4 optical interference layersJournal of Vacuum Science and Technology, 1977
- Beam effects in Auger electron spectroscopy analysis of titanium oxide filmsJournal of Vacuum Science and Technology, 1977
- Electron stimulated desorption: Principles and recent developmentsSurface Science, 1975
- Chlorine reactions on the Si (111) surfaceSurface Science, 1969
- On overturning and anchoring of monolayers - II. Surface diffusionProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1954