The measurement of atomic number and composition in an SEM using backscattered detectors
- 1 October 1981
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 124 (1) , 57-68
- https://doi.org/10.1111/j.1365-2818.1981.tb01305.x
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- The structures expected in a simple ternary eutectic system: Part II. The Al-Ag-Cu ternary systemMetallurgical Transactions A, 1980
- The structures expected in a simple ternary eutectic system: Part 1. TheoryMetallurgical Transactions A, 1980
- Physical background of electron backscatteringScanning, 1978
- Electron channelling patterns in scanning electron microscopyJournal of Materials Science, 1977
- Depth resolution of the low- and high-deflection backscattered electron images in the scanning electron microscopePhysica Status Solidi (a), 1976
- Atomic number intensity profiles in the scanning electron microscope—gold and aluminiumJournal of Microscopy, 1976
- Rétrodiffusion (backscattering) des électrons par les solutions et les alliagesJournal de Physique et le Radium, 1956
- Backscattering of Kilovolt Electrons from SolidsPhysical Review B, 1954