A study of Ar implantation induced defects in SiO2
- 15 May 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 209-210, 1201-1206
- https://doi.org/10.1016/0167-5087(83)90939-0
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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