Scanning tunneling microscope with micrometer approach and thermal compensation
- 1 August 1987
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 58 (8) , 1349-1352
- https://doi.org/10.1063/1.1139414
Abstract
A scanning tunneling microscope that uses a micrometer coarse approach mechanism is described. The approach mechanism can be decoupled from the rest of the microscope to result in a thermally compensated instrument. Thirty minutes after establishing tunneling, lateral thermal drift in our instrument is down to 0.5 Å/min. Construction details of the microscope and high resolution images of pyrolytic graphite and 2H-NbSe2 samples are presented.Keywords
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