E-T based statistical modeling and compact statistical circuit simulation methodologies
- 23 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Realistic worst-case SPICE file extraction using BSIM3Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Circuit sensitivity analysis in terms of process parametersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A physical compact MOSFET model, including quantum mechanical effects, for statistical circuit design applicationsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Relating statistical MOSFET model parameter variabilities to IC manufacturing process fluctuations enabling realistic worst case designIEEE Transactions on Semiconductor Manufacturing, 1994