Abstract
The complex current fluctuations observed in connection with microplasma breakdown can be explained by a simple model containing two constants: extrapolated breakdown voltage Vb and series resistance Rs; and two continuous probability functions: turnoff probability per unit time p10(I) as a function of pulse current I and turn-on probability per unit time p01. Experimental methods allowing an accurate measurement of these four quantities are described. The new concept of an extrapolated breakdown voltage Vb is discussed based on two independent measurements: one of secondary multiplication and the other of instantaneous current, both as a function of voltage. Within the experimental accuracy of 20 mV both methods extrapolated to one and the same breakdown voltage. The turnoff probability p10(I) is determined by a new combination of experimental techniques to cover the current range from 5 to 70 μA with a variation of 11 decades for p10(I). The observation of a narrow turnoff interval is explained quantitatively.

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