Observation of Topography and Optical Image of Optical Fiber End by Atomic Force Mode Scanning Near-Field Optical Microscope
- 1 January 1995
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 34 (1R)
- https://doi.org/10.1143/jjap.34.321
Abstract
A scanning near-field optic/atomic force microscope (SNOAM) was improved using a novel optical fiber probe. The optical fiber probe has a mirror grounded on the ridge for the optical lever of AFM. The resonant characteristics of the optical fiber probe were adequate for a noncontact AFM cantilever: the typical Q factor and resonant frequency were 574 and 10.9 kHz, respectively. The topographical and optical resolution of the SNOAM was better than 100 nm for a standard sample of chromium patterns on a quartz substrate. The SNOAM successfully provided topographies and optical images of optical fiber ends simultaneously. These images indicated that the optical pattern of the core was markedly influenced by the surface roughness of the optical fiber end.Keywords
This publication has 19 references indexed in Scilit:
- Superresolution optical imaging with a high-brightness subwavelength light sourceUltramicroscopy, 1992
- Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction LimitScience, 1992
- A Photon Scanning Tunneling Microscope Using an AlGaAs LaserJapanese Journal of Applied Physics, 1991
- External and internal reflection near field microscopy: experiments and resultsApplied Optics, 1990
- A Light Source Smaller Than the Optical WavelengthScience, 1990
- New form of scanning optical microscopyPhysical Review B, 1989
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- Microscopy and pattern generation with scanned evanescent wavesApplied Optics, 1984
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982