A new method for measuring the dielectric loss of highly absorbing media: Variable angle reflectivity from surface liquid films
- 1 April 1987
- journal article
- Published by Elsevier in Journal of Molecular Liquids
- Vol. 33 (4) , 271-277
- https://doi.org/10.1016/0167-7322(87)80013-2
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Calculation of the infrared reflection spectra of inhomogeneously doped silicon semiconductor layers at an arbitrary angle of incidenceJournal of Applied Physics, 1986
- Power reflection spectroscopy near the brewster angle. Molecular dynamics of liquidsJournal of the Chemical Society, Faraday Transactions 2: Molecular and Chemical Physics, 1980
- Calculation of IR reflection spectra of inhomogeneously doped semiconductorsInfrared Physics, 1978