Calculation of the infrared reflection spectra of inhomogeneously doped silicon semiconductor layers at an arbitrary angle of incidence
- 15 March 1986
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 59 (6) , 1822-1828
- https://doi.org/10.1063/1.336406
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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