Thin-Film Deposition of Cu2O by Reactive Radio-Frequency Magnetron Sputtering

Abstract
Deposition conditions of cuprous oxide (Cu2O) thin films on glass substrates by reactive radio-frequency (rf) magnetron sputtering method were studied. The substrate temperature was found to be important for obtaining high-quality films, and the optimum substrate temperature was about 500°C. The Cu2O deposited at 500°C shows a band-gap energy of about 2.0 eV and a typical hole concentration of the order of 1015 cm-3 with a Hall mobility of 60 cm2/Vs, which is the highest mobility reported thus far.