Integration of buried insulators with high thermal conductivity in SOI MOSFETs: Thermal properties and short channel effects
- 30 September 2005
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 49 (9) , 1522-1528
- https://doi.org/10.1016/j.sse.2005.07.015
Abstract
No abstract availableKeywords
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