Dotierungseigenschaften von Rhodium und Iridium in Silizium
- 16 September 1985
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 91 (1) , 143-152
- https://doi.org/10.1002/pssa.2210910119
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Eigenschaften der Energieniveaus von Rhodium und Iridium in SiliziumPhysica Status Solidi (a), 1984
- Rhodium and iridium as deep impurities in siliconSolid-State Electronics, 1976
- Properties of Au, Pt, Pd and Rh levels in silicon measured with a constant capacitance techniqueSolid-State Electronics, 1974