Improving functional density using run-time circuit reconfiguration [FPGAs]
- 1 June 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- Vol. 6 (2) , 247-256
- https://doi.org/10.1109/92.678880
Abstract
The ability to provide flexibility and allow fine-grain circuit specialization make field programmable gate arrays (FPGA's) ideal candidates for computing elements within application-specific architectures. The benefits of gate-level specialization and reconfigurability can be extended by reconfiguring circuit resources at run-time. This technique, termed run-time reconfiguration (RTR), allows the exploitation of dynamic conditions or temporal locality within application-specific problems. For several applications, this technique has been shown to reduce the hardware resources required for computation. The use of this technique on conventional FPGA's, however, requires additional time for circuit reconfiguration. A functional density metric is introduced that balances the advantages of RTR against its associated reconfiguration costs. This metric is used to justify run-time reconfiguration against other more conventional approaches. Several run-time reconfigured applications are presented and analyzed using this approach.Keywords
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