Evidence for a solid state reaction at the a-SiSnOx interface: An x-ray photoelectron spectroscopy study
- 1 November 1986
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 144 (1) , 133-137
- https://doi.org/10.1016/0040-6090(86)90075-1
Abstract
No abstract availableKeywords
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