The relationship between the film properties and the preparation conditions for a-Si:H grown by homogeneous chemical vapour deposition
- 1 December 1994
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 9 (12) , 2285-2289
- https://doi.org/10.1088/0268-1242/9/12/021
Abstract
A study is presented of a-Si:H films prepared by homogeneous chemical vapour deposition (HOMOCVD). a-Si:H is known as a material which is rather stable against degradation by light. The effect of deposition conditions on the parameters characterizing the structural and electronic properties of the films is studied, and two general cases of constant and variable gas-phase conditions were considered. The obtained data suggest that the optoelectronic properties of HOMOCVD a-Si:H are not strongly related to the structural parameters characterizing the film structure on a large scale and a certain decrease in the density and homogeneity of the a-Si:H films does not lead to their deterioration.Keywords
This publication has 14 references indexed in Scilit:
- a-Si:H thin film microstructure influenced by HOMOCVD-process parametersSolar Energy Materials and Solar Cells, 1993
- Optoelectronic properties of hydrogenated amorphous silicon films deposited under negative substrate biasJournal of Applied Physics, 1991
- Influence of UV irradiation on a-Si:H film growthJournal of Non-Crystalline Solids, 1991
- Microstructure and Optical Properties in CVD a-Si: H FilmsPhysica Status Solidi (a), 1990
- Preparation of hydrogenated amorphous silicon with tunable gap by homogeneous chemical vapor depositionJournal of Applied Physics, 1990
- Relationship between optical and structural properties of hydrogenated amorphous siliconApplied Physics A, 1989
- Dependence of glow discharge Si:H:Cl film morphology on diluent gas and SiCl4 partial pressureApplied Physics A, 1988
- Field-assisted ion exchange for the detection of localized defects in thin films on glass substratesThin Solid Films, 1988
- Revelation of micropores in a-Si:H filmsSolar Energy Materials, 1988
- Determination of surface roughness and optical constants of inhomogeneous amorphous silicon filmsJournal of Physics E: Scientific Instruments, 1984