Dynamic safe-area protection for power transistors employs peak-temperature limiting
- 1 February 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 22 (1) , 77-84
- https://doi.org/10.1109/jssc.1987.1052674
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Three-dimensional transient thermal simulation: application to delayed short circuit protection in power ICsIEEE Journal of Solid-State Circuits, 1980
- 5A regulator with thermal gradient controlled current limitPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1979
- Integrated-circuit thermal modelingIEEE Journal of Solid-State Circuits, 1978
- Reliability and thermal impedance studies in soft soldered power transistorsIEEE Transactions on Electron Devices, 1976
- Effects of Fast Temperature Cycling on Aluminum and Gold Metal Systems8th Reliability Physics Symposium, 1975
- New developments in IC voltage regulatorsIEEE Journal of Solid-State Circuits, 1971
- Silicon Transistor Biasing for Linear Collector Current Temperature DependenceIEEE Journal of Solid-State Circuits, 1967