Rapid evaluation of the root causes of BJT mismatch
- 7 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Automated extraction of matching parameters for bipolar transistor technologiesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Measurement of lithographical proximity effects on matching of bipolar transistorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A comprehensive vertical BJT mismatch modelPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002