Anisotropic properties of the high-quality epitaxial ${\mathrm{YBa}}_2$${\mathrm{Cu}}_3$${\mathrm{O}}_{7\mathrm{-}\mathrm{\delta }}$(110) thin film

High-quality (${\mathit{T}}_{\mathit{c}}$∼86 K and phase-purity >99%) epitaxial ${\mathrm{YBa}}_2$ ${\mathrm{Cu}}_3$ ${\mathrm{O}}_{7\mathrm{-}\mathrm{\delta }}$(110) thin films have been obtained by inverted-cylindrical-magnetron-sputtering deposition on a single-crystal (110) ${\mathrm{SrTiO}}_3$ substrate. A unique feature of this film is the in-plane alignment of the c axis of the ${\mathrm{YBa}}_2$ ${\mathrm{Cu}}_3$ ${\mathrm{O}}_{7\mathrm{-}\mathrm{\delta }}$ film in a single direction, which is very important for the study of the anisotropy in this material. The crystal orientation of the film has been investigated using x-ray diffraction to collect pole figures. Our resistivity and optical-reflectivity measurements have revealed pronounced anisotropic behavior.