Glancing Angle EXAFS Studies of Tungsten-Carbon Multilayers
- 1 January 1987
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- AES sputtering depth profile analysis of C/W layered synthetic microstructuresApplied Surface Science, 1987
- Anomalous expansion of tungsten-carbon multilayers used in x-ray opticsJournal of Applied Physics, 1986
- Stability of multilayers for synchrotron opticsApplied Physics Letters, 1986
- Thermal Stability of W/C Multilayer FilmsPublished by SPIE-Intl Soc Optical Eng ,1985