Short-range order investigation in a-Si:H by EXAFS
- 1 December 1983
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 59-60, 237-240
- https://doi.org/10.1016/0022-3093(83)90565-3
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
- Order and disorder in amorphous, tetrahedrally coordinated semiconductors A curved-space descriptionPhilosophical Magazine Part B, 1982
- Line defects and tunnelling modes in glassesJournal de Physique, 1982
- Structural investigation of hydrogenated amorphous silicon by X-ray diffractionPhilosophical Magazine Part B, 1981
- Model of hydrogenated amorphous siliconPhysical Review B, 1981
- Structural studies of hydrogenated amorphous siliconSolar Cells, 1980
- Small-Angle-Scattering Evidence of Voids in Hydrogenated Amorphous SiliconPhysical Review Letters, 1979
- Soft X-ray absorption and EXAFS on the K edge of aluminiumJournal of Physics F: Metal Physics, 1979
- Structure of glow discharge amorphous siliconPhysica Status Solidi (a), 1979
- A model structure for hydrogenated amorphous siliconPhilosophical Magazine Part B, 1979
- X-ray diffraction study of the effect of hydrogen atoms on the Si–Si atomic short-range order in amorphous siliconPhysica Status Solidi (a), 1979