A photoelectron spectrometer for k-space mapping above the Fermi level
- 1 December 1997
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 68 (12) , 4549-4554
- https://doi.org/10.1063/1.1148429
Abstract
The setup of an electron spectrometer for angle-resolved photoemission is described. A sample goniometer offers the opportunity for angle scanned photoemission over 2π solid angle above the surface. A monochromatized high flux He discharge photon source is exploited to measure thermally populated electronic states above the Fermi level E F . At energies greater than E F +5k B T the signal from a constant density of states declines below the photoelectron background caused by photons with higher energies than He Iα (21.2 eV). For He IIα (40.8 eV) the residual photoelectron background is lower and photoemission up to 6k B T above E F can be performed. Data showing two cuts through the Fermi surface of silver are presented. Furthermore the dispersion of the Shockley surface state on Ag (111) above the Fermi energy is quantified.Keywords
This publication has 10 references indexed in Scilit:
- Final-state scattering in angle-resolved ultraviolet photoemission from copperPhysical Review B, 1996
- Photoemission with high angular and energy resolution: Temperature dependent exchange splitting in nickelSolid State Communications, 1995
- Temperature dependence of Shockley-type surface energy bands on Cu(111), Ag(111) and Au(111)Surface Science, 1995
- Fermi surface mapping with photoelectrons at UV energiesSurface Science, 1994
- Resolution and signal-to-background enhancement in gas-phase electron spectroscopyReview of Scientific Instruments, 1993
- Experimental full-solid-angle substrate photoelectron-diffraction data at 1-keV energies: Implications for photoelectron holographyPhysical Review B, 1991
- Orientational ordering in mixed cyanide crystals: (NaCN(KCNPhysical Review B, 1991
- Angle-resolved x-ray photoelectron spectroscopyProgress in Surface Science, 1984
- An ellipsoidal mirror display analyzer system for electron energy and angular measurementsNuclear Instruments and Methods, 1980
- Metal Photocathodes as Secondary Standards for Absolute Intensity Measurements in the Vacuum Ultraviolet*Journal of the Optical Society of America, 1966