Abstract
High quality GaAs/AlxGa1−xAs single and multiquantum well heterostructures were grown for the first time by chemical beam epitaxy. Studies using low-temperature photoluminescence and excitation spectroscopy techniques show that on the average these samples are similar in quality to similar structures from this laboratory grown by molecular beam epitaxy (MBE) and in certain specific characteristics superior to the MBE ones. Furthermore, in some important respects, they are also superior to those grown by organometallic chemical vapor deposition (OMCVD). The very small red shifts observed between emission and n=1 exciton transition E1h with continuous growth show that the emission is dominated by E1h excitons. An interface roughness of δL≲±a/2, where a is the lattice constant, and very square wells (undistorted) even with continuous growth, in contrast to OMCVD are inferred from the excitation spectra. Unusually sharp exciton transition peaks up to E3h including forbidden transitions were obtained in single quantum wells. Such high quality line shape has not been obtained in MBE or OMCVD grown wafers so far. The excitation spectra also show no evidence of band filling due to holes or electrons from the AlxGa1−xAs layers which is a common problem with the OMCVD technique. From this study, it is also shown that the GaAs and AlxGa1−xAs materials are of very high purity.