The influence of high implant concentration on solid phase epitaxial regrowth in (100) and (111) silicon
- 1 January 1980
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects
- Vol. 48 (1-4) , 157-160
- https://doi.org/10.1080/00337578008209247
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- The application of high-resolution Rutherford backscattering techniques to near-surface analysisNuclear Instruments and Methods, 1978
- The recrystallization of ion-implantedsilicon layersRadiation Effects, 1978
- Influence of 16O, 12C, 14N, and noble gases on the crystallization of amorphous Si layersJournal of Applied Physics, 1977
- The recrystallization of ion implanted silicon layers. I. Pb-Ion implanted siRadiation Effects, 1977
- Influence of thermal history on the residual disorder in implanted siliconRadiation Effects, 1976
- On the annealing of damage produced by copper ion implantation of silicon single crystalsRadiation Effects, 1974