Phase detection of electrostatic force by AFM with a conductive tip

This publication has 15 references indexed in Scilit:

• Cross-Sectional Potential Imaging of Compound Semiconductor Heterostructure by Kelvin Probe Force Microscopy
  Japanese Journal of Applied Physics, 1998
• Kelvin Probe Force Microscopy for Potential Distribution Measurement of Cleaved Surface of GaAs Devices
  Japanese Journal of Applied Physics, 1997
• Nanometer-scale imaging of potential profiles in optically excited n-i-p-i heterostructure using Kelvin probe force microscopy
  Applied Physics Letters, 1995
• Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy
  Applied Physics Letters, 1995
• Atomic ordering of GaInP studied by Kelvin probe force microscopy
  Applied Physics Letters, 1995
• Nature of strained InAs three-dimensional island formation and distribution on GaAs(100)
  Applied Physics Letters, 1994
• Molecular-beam epitaxy growth of quantum dots from strained coherent uniform islands of InGaAs on GaAs
  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1994
• Self-organized growth of regular nanometer-scale InAs dots on GaAs
  Applied Physics Letters, 1994
• Kelvin probe force microscopy
  Applied Physics Letters, 1991
• Atomic Force Microscope
  Physical Review Letters, 1986