Noise in integrated-circuit transistors
- 1 April 1970
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 5 (2) , 63-66
- https://doi.org/10.1109/jssc.1970.1050072
Abstract
Recent noise measurement from 1 Hz to 5 kHz on integrated-circuit transistors have shown an anomalous burst noise in addition to the usual noise spectrum. The terminal characteristics of the burst noise are presented and a phenomenological noise-circuit model is developed.Keywords
This publication has 5 references indexed in Scilit:
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- Characteristics of burst noiseProceedings of the IEEE, 1965
- Design considerations for an integrated low-noise preamplifierProceedings of the IEEE, 1965
- Flicker noise in transistorsIEEE Transactions on Electron Devices, 1963