Picosecond Electrical Pulse for VLSI Electronics Characterization
- 1 January 1987
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Noninvasive sheet charge density probe for integrated silicon devicesApplied Physics Letters, 1986
- Generation of subpicosecond electrical pulses on coplanar transmission linesApplied Physics Letters, 1986
- Picosecond Characterization of Ultrafast Phenomena: New Devices and New TechniquesPublished by Springer Nature ,1986
- Picosecond optoelectronic measurement of the high-frequency scattering parameters of a GaAs FETIEEE Journal of Quantum Electronics, 1986
- Modeling of Picosecond Pulse Propagation on Silicon Integrated CircuitsPublished by Springer Nature ,1985
- Picosecond Photoconductors: Physical Properties and ApplicationsPublished by Elsevier ,1984