Picosecond optoelectronic measurement of the high-frequency scattering parameters of a GaAs FET
- 1 January 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 22 (1) , 94-100
- https://doi.org/10.1109/jqe.1986.1072878
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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