A comprehensive MOSFET mismatch model

Publisher Website

22 January 2003

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iedm.1999.823871

Abstract

No abstract available

This publication has 2 references indexed in Scilit:

A comprehensive vertical BJT mismatch model
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
Matching properties of MOS transistors
IEEE Journal of Solid-State Circuits, 1989