Advanced electron holography: a new algorithm for image processing and a standardized quality test for the FEG electron microscope
- 30 April 1995
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 58 (1) , 97-103
- https://doi.org/10.1016/0304-3991(94)00182-m
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Optimum focus for taking electron hologramsUltramicroscopy, 1991
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