Bias circuit instabilities and their effect on the d.c. current-voltage characteristics of double-barrier resonant tunneling diodes
- 28 February 1991
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 34 (2) , 149-156
- https://doi.org/10.1016/0038-1101(91)90081-9
Abstract
No abstract availableKeywords
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